| ⇦ | 
| ⇨ |
To measure the roughness of the surface of a material, which of the following microscope is preferred for better result output?
Options
(a) Compound microscope
(b) Electron microscope
(c) Atomic force microscope
(d) None of the above
Correct Answer:
Atomic force microscope
Explanation:
No explanation available. Be the first to write the explanation for this question by commenting below.
Related Questions: - A parallel plate air capacitor of capacitance C is connected to a cell of emf
- Two spheres of mass m and M are situated in air and the gravitational force
- A rod lies along the X-axis with one end at the origin and the other at x→∞. It carries
- The operation of a nuclear reactor is said to be critical, if the multiplication
- An A.C source is rated at 220 V, 50 Hz. The time taken for voltage to change
Topics: Ray Optics
(94)
Subject: Physics
(2479)
Important MCQs Based on Medical Entrance Examinations To Improve Your NEET Score
- A parallel plate air capacitor of capacitance C is connected to a cell of emf
- Two spheres of mass m and M are situated in air and the gravitational force
- A rod lies along the X-axis with one end at the origin and the other at x→∞. It carries
- The operation of a nuclear reactor is said to be critical, if the multiplication
- An A.C source is rated at 220 V, 50 Hz. The time taken for voltage to change
Topics: Ray Optics (94)
Subject: Physics (2479)
Important MCQs Based on Medical Entrance Examinations To Improve Your NEET Score
18000+ students are using NEETLab to improve their score. What about you?
Solve Previous Year MCQs, Mock Tests, Topicwise Practice Tests, Identify Weak Topics, Formula Flash cards and much more is available in NEETLab Android App to improve your NEET score.
Share this page with your friends
Leave a Reply