| ⇦ | 
| ⇨ |
To measure the roughness of the surface of a material, which of the following microscope is preferred for better result output?
Options
(a) Compound microscope
(b) Electron microscope
(c) Atomic force microscope
(d) None of the above
Correct Answer:
Atomic force microscope
Explanation:
No explanation available. Be the first to write the explanation for this question by commenting below.
Related Questions: - The given graph represents V-I characteristic for a semiconductor device
- Minority carriers in a p-type semiconductor are
- When a wire of uniform cross-section a, length l and resistance R
- On observing light from three different stars P, Q and R, it was found that intensity
- A bucket full of water is revolved in a vertical circle of 2m
Topics: Ray Optics
(94)
Subject: Physics
(2479)
Important MCQs Based on Medical Entrance Examinations To Improve Your NEET Score
- The given graph represents V-I characteristic for a semiconductor device
- Minority carriers in a p-type semiconductor are
- When a wire of uniform cross-section a, length l and resistance R
- On observing light from three different stars P, Q and R, it was found that intensity
- A bucket full of water is revolved in a vertical circle of 2m
Topics: Ray Optics (94)
Subject: Physics (2479)
Important MCQs Based on Medical Entrance Examinations To Improve Your NEET Score
18000+ students are using NEETLab to improve their score. What about you?
Solve Previous Year MCQs, Mock Tests, Topicwise Practice Tests, Identify Weak Topics, Formula Flash cards and much more is available in NEETLab Android App to improve your NEET score.
Share this page with your friends
Leave a Reply